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NEW Scanning Electron Microscope (SEM)

Enhanced Services for Metallurgical and Corrosion-related Assessment

Kinectrics' new JEOL 7401F will be used in metallurgical and corrosion-related assessments, including characterization of feeder microstructure and texture analysis, evaluation of degradation mechanisms in steam generator tubing, and failure analysis of components and materials.

Enhanced assessment services

The greater resolution offered by the new 7401F over that of existing equipment enables Kinectrics to better characterize degradation modes and mechanisms in power plant components and materials.  

With enhanced capability in x-ray microanalysis and texture analysis, Kinectrics can now assess microstructural features, including very small grain-size materials, highly insulating oxides, and facilitate compositional contrasting with surface morphology effects to better understand corrosion-related degradation for many components in the primary side CANDU systems.

JEOL 7401F - Features

The JEOL 7401F is an ultra-high resolution, cold field emission (FE) scanning electron microscope equipped with a high brightness conical objective lens (semi in-lens).  The improved overall stability of the 7401F enables specimen magnification up to 1 million times with a guaranteed resolution of 1 nm. A stage voltage bias feature also provides enhanced capability for examining highly insulating samples such as oxides. 

The JEOL 7401F is equipped with the Oxford Inca Energy 450 x-ray microanalysis system, which is the state-of-the-art system for elemental and phase analysis, enabling fast, accurate spectra gathering, multiple line scans and elemental mapping.

For more information, contact

Allan Jarvine, 416.207.6000 x5785, allan.jarvine@kinectrics.com

 

 

 

Content last modified: 2007-08-28